Taqman Probes
Beacon Designer v.7 91
Beacon Designer™ automates the design of real time primers and probes. It is used by molecular biologists worldwide to design successful real time PCR assays. It saves the time and the money involved in failed experiments.
Http-ping
http-ping is a small, free, easy-to-use command-line utility that probes a given URL and displays relevant statistics. It is similar to the popular 'ping' utility, but works over HTTP/S instead of ICMP, and with a URL instead of a computer name/IP
NDI 6D Architect v.3.0
NDI 6D Architect™ enables users to develop rigid bodies for determining 6DOF data of body segments and objects. NDI 6D Architect also enables users to build and qualify digitizing probes (for designing imaginary markers and general digitizing).
MutationDetector v.1.0
Applied Biosystems Mutation Detector™ Software is an automated data analysis tool that performs mutation detection analysis of real-time PCR quantitation data from TaqMan® Mutation Detection Assay research experiments.
REST 2008 v.2.0.7
REST 2008 is a standalone software package for analyzing gene expression using real-time amplification data.
Ls8xxCPw 04 v.0.4
The most advanced portable ultrasonic flow meter is available. All pipe types even very rusty with or without coating (steel, stainless steel, PVC, asbestos, cement, cast-iron...) For the concrete, use intrusive probes. All liquid types.
OligoLocator v.1.0
Oligonucleotides analysis made easy. OligoLocator is a simple tool for locating probes and PCR primers within larger sequences.Procedure 1. Enter oligonucleotide. 2. Enter sequence. 3. Select maximum number of mismatches allowed between
SNPman v.1.0
SNPman aids in TaqMan genotyping across various platforms (ABI7300, LC480, Biorad). The algorithm utilizes an insight into the dynamics of amplification,
CBA Reading Probe Dev. Program v.1.2
This program is used in developing Reading Probes for Curriculum Based Assessment.
Wafermap v.3 2
WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers.